Scanning electron microscopes (Нидерланды - Тендер #45786093) | ||
| ||
Для перевода текста тендера на нужный язык воспользуйтесь приложением: | ||
Страна: Нидерланды (другие тендеры и закупки Нидерланды) Организатор тендера: Technische Universiteit Delft Номер конкурса: 45786093 Дата публикации: 05-09-2023 Источник тендера: Единая система закупок Европейского союза TED |
||
Netherlands-Delft: Scanning electron microscopes
2023/S 170-535002
Voluntary ex ante transparency notice
Supplies
Section I: Contracting authority/entity
Section II: Object
Voluntary transparency note - Scanning Electron Microscope
The department of Materials Science and Engineering of the faculty of 3ME of Delft University of Technology (hereafter TU-Delft) is planning to acquire a new analytical Scanning Electron Microscope (SEM) facility that should include EDS (Energy Dispersive Spectroscopy) and EBSD (Electron Back-Scatter Diffraction).
In order to acquire the system that provides the best solution to our demands, we have requested the market to perform EDS and EBSD analysis on two selected samples and send to us the corresponding results.
The results have been evaluated in relation to our requirements and high resolution images at both low and high beam currents made on standard carbon-gold or tin ball specimen.
Based on the results on the supplied test results from the manufacturers and quotations received, we concluded which is the system which surpasses all of the listed requirements, within our maximum available budget and also provided the best scanning resolutions at high current.
combination of the JSM-IT800SHL FEG-SEM system offered by JEOL combined with the Oxford Instruments AztecLive Advanced Ultim Max 100mm² combined with Oxford Instruments AztecHKL Advanced EBSD system with Symmetry S3
Section IV: Procedure
The contracting authority has investigated whether there are suppliers on the market that can meet the specific requirements for the needed Scanning Electron Microscope including EDS and EBSD. Apart from the 5 contacted suppliers stated in the attached letter, TU Delft is not aware of additional manufacturers.
In order to acquire the system that provides the best solution to our demands, we have requested these manufacturers to perform EDS and EBSD analysis on two selected samples and send to us the corresponding results.
The results have been evaluated in relation to our requirements and high resolution images at both low and high beam currents made on standard carbon-gold or tin ball specimen.
In conclusion, JEOL is the supplier that offered the best combination for our research projects.
Section V: Award of contract/concession
Section VI: Complementary information
Please see attached PDF