Supply, Delivery and Installation of a Transmission Electron Microscopy (TEM) Suite consisting of 2 TEM tools and 1 Focused Ion Beam–Scanning Electron Microscope (FIB.SEM) for Tyndall Instit, UCC, (Греция - Тендер #68498315)

Supply, Delivery and Installation of a Transmission Electron Microscopy (TEM) Suite consisting of 2 TEM tools and 1 Focused Ion Beam–Scanning Electron Microscope (FIB.SEM) for Tyndall Instit, UCC,

Description: Tenders are sought for the Supply, Delivery and Installation of a Transmission Electron Microscopy (TEM) Suite, to Tyndall National Institute, University College Cork (UCC) comprising three complementary instruments: 1. One (1) Aberration-corrected and monochromated TEM 2. One (1) 200 kV high-throughput TEM 3. One (1) Focused Ion Beam–Scanning Electron Microscope (FIB-SEM) This procurement will establish a nationally significant microscopy capability for Ireland, strengthening Tyndall’s leadership in semiconductor, photonic, and quantum materials research and supporting long-term collaboration with academic and industrial stakeholders. The TEM Suite will deliver sustained scientific, technological, and economic impact through enhanced analytical capability, research excellence, and innovation at the nanoscale. This investment will expand and modernise Tyndall’s capability in advanced materials and device characterisation to meet the requirements of its national and international research programmes, including activities under the EU Chips Act and strategic collaborations with academic and industrial partners. The TEM Suite will form a key component of the new Tyndall laboratory facilities currently under development and will support Tyndall’s mission to provide world-leading infrastructure for semiconductor, photonic, and quantum technologies. The Aberration-corrected and monochromated TEM will represent the highest-performance instrument within the suite. It must deliver sub-ångström imaging resolution and high-energy-resolution spectroscopy, providing the capability to study interfaces, defects, and nanostructures at the atomic scale. The system must support advanced analytical and imaging modes, including low-dose operation for beam-sensitive materials, Lorentz and 4D-STEM imaging, and in-situ experimentation (electrical, thermal, and environmental). Automated alignment, optical stability, and full integration with advanced camera, detector, and control software are essential to ensure repeatable and high-quality data generation across multiple users. The 200 kV high-throughput TEM capable of atomic resolution imaging will provide a complementary, multi-user analytical capability to support daily research operations and routine analysis. It must combine high brightness and excellent spatial resolution with rapid operational stability, user-friendly alignment, and automated workflow functionality. This instrument will be optimised for versatility and efficiency, ensuring broad accessibility for internal and collaborative research, training, and industry engagement activities. The FIB-SEM will enable site-specific sample preparation, 3D structural analysis, and nanoscale milling to support both TEM systems. It must achieve high-resolution imaging and precision ion-beam milling for lamella production and cross-sectional analysis. Integration with the TEM workflows is required to ensure seamless specimen transfer and preparation from wafer-scale structures to atomic-scale analysis. This tender is being issued as a single integrated suite rather than as separate tools to ensure technical, operational, and economic coherence across all instruments. Procuring the TEMs and FIB-SEM from a single manufacturer will enable a shared control software platform, providing a consistent user interface and operational framework across the suite. This is important in Tyndall’s multi-user research and training environment, for staff, postgraduate students, and industry partners, as it simplifies training, improves safety, and promotes efficient use of laboratory time. A unified suite will also allow for the interchange of sample holders and accessories, enabling seamless workflow integration from sample preparation to atomic-scale imaging. A single-supplier arrangement provides additional benefits including simplified warranty and maintenance agreements, harmonised service schedules, and a single point of technical contact.

Issue Date: 10.11.2025 03:00

Submission Deadline: 13.11.2025 15:00

CPV Codes: 38000000, 38510000, 38511000, 38511200, 33124100, 33124110, 38300000, 38340000, 38400000, 38900000

Documentation: https://www.etenders.gov.ie/epps/cft/listContractDocuments.do?resourceId=6943659

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