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Procurement of 4197-2440HXWN0001/09 8 Inch Mems Wafer Project(2) (Китайская Народная Республика - Тендер #55174918) | ||
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Страна: Китайская Народная Республика (другие тендеры и закупки Китайская Народная Республика) Номер конкурса: 55174918 Дата публикации: 01-07-2024 Источник тендера: www.chinabidding.com |
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Procurement of 4197-2440HXWN0001/09 8 Inch Mems Wafer Project(2)
| NO. | Product Name | Quantity | Main Technical Data | Remarks |
| 4197-2440HXWN0001/08 | Wafer thickness measurement system | 1 set | This system is required to be reasonable in design, with advanced technology to ensure the system an excellent kinetic performance. The action elements selected for the control system shall be of high accuracy, good reliability and rapid response. The machine shall be convenient for use, operation and maintenance, be artistic in configuration, compact in structure, stable in performance and satisfactory in after-sale service. | |
| 4197-2440HXWN0001/09 | SOI Wafer thickness measurement system | 1 set | This system is required to be reasonable in design, with advanced technology to ensure the system an excellent kinetic performance. The action elements selected for the control system shall be of high accuracy, good reliability and rapid response. The machine shall be convenient for use, operation and maintenance, be artistic in configuration, compact in structure, stable in performance and satisfactory in after-sale service. | |
| 4197-2440HXWN0001/10 | Inertial testing system | 1 set | This system is required to be reasonable in design, with advanced technology to ensure the system an excellent kinetic performance. The action elements selected for the control system shall be of high accuracy, good reliability and rapid response. The machine shall be convenient for use, operation and maintenance, be artistic in configuration, compact in structure, stable in performance and satisfactory in after-sale service. |