Sources Sought Notice for LEAP 6000 XR atom probe instrument (Соединенные Штаты Америки - Тендер #58322471) | ||
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Страна: Соединенные Штаты Америки (другие тендеры и закупки Соединенные Штаты Америки) Номер конкурса: 58322471 Дата публикации: 21-10-2024 Источник тендера: Государственные закупки США |
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APEX Accelerators are an official government contracting resource for small businesses. Find your local APEX Accelerator (opens in new window) for free government expertise related to contract opportunities.
APEX Accelerators are funded in part through a cooperative agreement with the Department of Defense.
The APEX Accelerators program was formerly known as the Procurement Technical Assistance Program (opens in new window) (PTAP).
The purpose of this sources sought notice is to conduct market research and identify potential sources of commercial products/services that satisfy the Government’s anticipated needs.
BACKGROUND
The National Institute of Standards and Technology (NIST), Material Measurement Laboratory (MML) is involved in materials characterization efforts to support multiple projects. Materials characterization allows NIST scientists to make direct correlations between material processing, (nano)structure, and resulting properties. This work involves three-dimensional (3D) atomic imaging of nanoscale samples in an atom probe tomography (APT) instrument. An APT instrument: (1) accepts nanoscale needle-shaped specimens and specimen array coupons for analysis, (2) triggers field ion evaporation of the specimen, (3) detects the emitted ions in time and space, and (4) generates a 3-Dimensional (3D) computational reconstruction of the evaporated volume that can be used in further analysis. In this work, the APT instrument should trigger field ion evaporation with either a voltage pulse, a deep-ultraviolet (λ < 280 nm) laser pulse, or a synchronous voltage + laser pulse and should be capable of wide field-of-view detection (local electrode atom probe) such that it can be applied to complex heterogenous samples containing materials with a wide range of optical and electronic properties.
Consistent with NIST’s mission to perform and develop measurement science, a particular research focus of the instrument will be the development of reference materials, benchmarks, data sets, and standard practices to characterize, quantify, and ameliorate sources of measurement bias and uncertainty, thereby improving accuracy, repeatability, and reproducibility of APT measurements.
A local electrode atom probe (LEAP) tomography instrument. The APT system will be installed in the Material Measurement Laboratory (MML) at the NIST Gaithersburg campus. Consistent with NIST’s mission to perform and develop measurement science, a particular research focus of the instrument will be the development of reference materials, benchmarks, data sets, and standard practices to characterize, quantify, and ameliorate sources of measurement bias and uncertainty, thereby improving accuracy, repeatability, and reproducibility of APT measurements. Samples of interest include (but are not limited to) semiconductor materials, microfabricated device structures, reference test structures, and metal alloys.
NIST is seeking information from sources that may be capable of providing a solution that will achieve the objectives described above, in addition to the following essential requirements:
Local Electrode Atom Probe (LEAP) Tomography System: A LEAP instrument: (1) accepts nanoscale needle-shaped specimens and specimen array coupons for analysis, (2) triggers field ion evaporation of the specimen, (3) detects the emitted ions in time and space, and (4) generates a 3-Dimensional (3D) computational reconstruction of the evaporated volume that can be used in further analysis.
Specifications:
HOW TO RESPOND TO THIS NOTICE
In responding to this notice, please DO NOT PROVIDE PROPRIETARY INFORMATION. Please include only the following information, readable in either Microsoft Word 365, Microsoft Excel 365, or .pdf format, in the response: Submit the response by email to the Primary Point of Contact and, if specified, to the Secondary Point of Contact listed in this notice as soon as possible, and preferably before the closing date and time of this notice. Please note that to be considered for award under any official solicitation, the entity must be registered and “active” in SAM at the time of solicitation response.
QUESTIONS REGARDING THIS NOTICE
Questions regarding this notice may be submitted via email to the Primary Point of Contact and the Secondary Point of Contact listed in this notice. Questions should be submitted so that they are received 5 days prior to the response date. If the Contracting Officer determines that providing a written amendment to this notice to document question(s) received would benefit other potential respondents, the questions would be anonymized, and a written response to such question(s) would be provided via an amendment to this notice.
IMPORTANT NOTES
This notice is for market research purposes and should not be construed as a commitment by NIST to issue a solicitation or ultimately award a contract. There is no solicitation available at this time.
This notice does not obligate the Government to award a contract or otherwise pay for the information provided in response.
NIST reserves the right to use information provided by respondents for any purpose deemed necessary and legally appropriate.
Any organization responding to this notice should ensure that its response is complete and sufficiently detailed to allow the Government to determine the organization’s capability.
Respondents are advised that the Government is under no obligation to acknowledge receipt of the information received or provide feedback to respondents with respect to any information submitted.
After a review of the responses received, a synopsis and solicitation may be published on GSA’s eBuy or SAM.gov. However, responses to this notice will not be considered an adequate response to any such solicitation(s).
The responses shall not exceed 10 pages including all attachments, charts, etc.
Thank you for taking the time to submit a response to this request!