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Procurement of 0729-254OIT611299 Procurement of High-Power Device Testing System Equipment for the Chongqing Carbon-Based Integrated Circuit Research Institute of Peking University(1) (Китайская Народная Республика - Тендер #67396902) | ||
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Страна: Китайская Народная Республика (другие тендеры и закупки Китайская Народная Республика) Номер конкурса: 67396902 Дата публикации: 30-09-2025 Источник тендера: www.chinabidding.com |
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Procurement of 0729-254OIT611299 Procurement of High-Power Device Testing System Equipment for the Chongqing Carbon-Based Integrated Circuit Research Institute of Peking University(1)
| NO. | Product Name | Quantity | Main Technical Data | Remarks |
| 1 | Power device analyzer, high-power probe station | One set each | For electrical parameter characterization of power devices such as gallium nitride, silicon carbide, IGBTs, etc. The characterized electrical parameters must include at least high-voltage parameters, high-current parameters, gate charge, and others. It can meet the requirements for electrical parameter extraction of wafer-level vertical and horizontal structures, as well as parameter characterization of packaged devices. Wafer-level is suitable for automated testing of the entire wafer and manual testing of bare dies. Automated testing of the entire wafer produces corresponding map outputs for later data processing. | Delivery time: Delivery shall be completed within 150 days after the contract is signed |